Wafer Parallel Test System

Categories : TESEC


The new 471-TT is a DC tester with a new concept that realizes simultaneous measurement of plural chips in the wafer process by utilizing measurement technology which we have been accumulating for many years. We have also succeeded to our high-voltage and current measurement technology as one of our advantages.  By measuring plural chips simultaneously, we can achieve a significant improvement in productivity compared to conventional testers.


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