Strip handler (4380-IH)

  We, Tesec is now introducing the new strip frame testing handler model 4380 that is for ambient and hot temperature testing without singular the SOIC devices attachedin matrix format on the strip frame.The device positions(x y z θ) are compensated before testing by visual alignment function, so that high accuracy of the device positioning and probe-pin contactor pressure for all of the devices are maintained as firm for stable testing and high indexing.

 

Features

  • High throughput
  • High withstand load and high thrust table
  • LOT control by barcode and 2-D code reader
  • Easy device type exchange only by few special parts exchange and screen setting
  • Auto-cleaning function unit is installed to clean the socket at any desired timing
  • S2/S8 regulation compliance
  • SEMI G85 compliance
  • SECS/GEM compliance

 

Specification

 Model 4380-IH
 Applicable device SOIC Type
 Applicable strip size Less than 250 x 70mm=
 Applicable magazine size W175~260.3mm、D40~80.3mm、H250~340mm
 Test station Multi-parallel
Contact method. Pogo-pin or specified contactor
 Supply magazine capacity 2 pcs
Stock magazine capacity 3 pcs

 

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